Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6934648 | Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal | Hisayoshi Hanai, Teruhiko Funakura | 2005-08-23 |
| 6900627 | Apparatus and method for testing semiconductor integrated circuit | Shinji Yamada, Teruhiko Funakura | 2005-05-31 |