Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6954079 | Interface circuit coupling semiconductor test apparatus with tested semiconductor device | Masaru Sugimoto, Hidekazu Nagasawa | 2005-10-11 |
| 6934648 | Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal | Hisayoshi Hanai, Hisaya Mori | 2005-08-23 |
| 6900627 | Apparatus and method for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2005-05-31 |