Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6963408 | Method and apparatus for point diffraction interferometry | Mikihiko Ishii, Jun Kawakami, Yasushi Fukutomi, Yutaka Ichihara | 2005-11-08 |
| 6940605 | Method for measuring interference and apparatus for measuring interference | Jun Kawakami | 2005-09-06 |