Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6959481 | Apertured probes for localized measurements of a material's complex permittivity and fabrication method | Robert Moreland, Vladimir V. Talanov, Andrew R. Schwartz | 2005-11-01 |
| 6856140 | System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes | Vladimir V. Talanov, Robert Moreland, Andrew R. Schwartz | 2005-02-15 |