Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6959481 | Apertured probes for localized measurements of a material's complex permittivity and fabrication method | Robert Moreland, Hans M. Christen, Vladimir V. Talanov | 2005-11-01 |
| 6943562 | Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits | Vladimir V. Talanov | 2005-09-13 |
| 6856140 | System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes | Vladimir V. Talanov, Robert Moreland, Hans M. Christen | 2005-02-15 |