MS

Michael Schweiger

NC Nanophotonics Co.: 1 patents #2 of 4Top 50%
📍 Paia, HI: #1 of 1 inventorsTop 100%
🗺 Hawaii: #20 of 90 inventorsTop 25%
Overall (2005): #134,890 of 245,428Top 55%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6954267 Device for measuring surface defects Michael Abraham, Andreas Lang 2005-10-11