Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6888344 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Megumi Takemoto, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2005-05-03 |
| 6885204 | Probe card, and testing apparatus having the same | Megumi Takemoto, Yoshihiro Kashiba, Yuetsu Watanabe | 2005-04-26 |
| 6882069 | Vehicle AC generator with rectifier diode package disposed between cooling plates | Toshiaki Kashihara, Yoshihiro Kashiba | 2005-04-19 |