Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6888344 | Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter | Shigeki Maekawa, Kazunobu Miki, Mutsumi Kano, Takahiro Nagata, Yoshihiro Kashiba | 2005-05-03 |
| 6885204 | Probe card, and testing apparatus having the same | Shigeki Maekawa, Yoshihiro Kashiba, Yuetsu Watanabe | 2005-04-26 |