Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6856155 | Methods and apparatus for testing and burn-in of semiconductor devices | Yong Kian Tan, Yong Poo Chia, Siu Waf Low, Suan Jeung Boon, Soon Huat Goh | 2005-02-15 |
| 6847220 | Method for ball grid array chip packages having improved testing and stacking characteristics | Jeffrey Toh Tuck Fook | 2005-01-25 |