Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6930765 | Multiple spot size optical profilometer, ellipsometer, reflectometer and scatterometer | Steven W. Meeks | 2005-08-16 |
| 6882437 | Method of detecting the thickness of thin film disks or wafers | Alireza Shahdoost Moghaddam | 2005-04-19 |
| D502477 | Linear actuator | Darryl Beadle, Kurt Robert Blankemeyer | 2005-03-01 |