Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6953939 | Testing apparatus using scanning electron microscope | Tetsuo Abe, Kouki Okawauchi, Tadashi Hattori, Hironori Fujita, Minoru Takeda +4 more | 2005-10-11 |
| 6904164 | Method of inspecting accuracy in stitching pattern elements | Manabu Saito, Akira Tohyama | 2005-06-07 |