Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6953939 | Testing apparatus using scanning electron microscope | Tetsuo Abe, Kouki Okawauchi, Hironori Fujita, Minoru Takeda, Yuichi Aki +4 more | 2005-10-11 |
| 6933185 | Polysilicon evaluating method, polysilicon inspection apparatus and method for preparation of thin film transistor | Hiroyuki Wada, Yoshimi Hirata, Ayumu Taguchi, Koichi Tatsuki, Nobuhiko Umezu +5 more | 2005-08-23 |