Issued Patents 2005
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943360 | Twisted-compensated low-energy electron microscope | — | 2005-09-13 |
| 6936816 | High contrast inspection and review of magnetic media and heads | David Aitan Soltz, Harald F. Hess | 2005-08-30 |
| 6930309 | Dual-energy electron flooding for neutralization of charged substrate | Donald J. Parker | 2005-08-16 |
| 6903338 | Method and apparatus for reducing substrate edge effects in electron lenses | David L. Adler | 2005-06-07 |
| 6878937 | Prism array for electron beam inspection and defect review | — | 2005-04-12 |
| 6870172 | Maskless reflection electron beam projection lithography | Harald F. Hess, David L. Adler, Kirk J. Bertsche | 2005-03-22 |
| 6858843 | Immersion objective lens for e-beam inspection | David L. Adler | 2005-02-22 |