Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6853206 | Method and probe card configuration for testing a plurality of integrated circuits in parallel | Michael Hübner, Gunnar Krause, Justus Kuhn, Jochen Müller, Jürgen Weidenhöfer | 2005-02-08 |