WH

William Paul Hovis

IBM: 1 patents #1,781 of 5,214Top 35%
📍 Rochester, MN: #99 of 340 inventorsTop 30%
🗺 Minnesota: #1,168 of 4,231 inventorsTop 30%
Overall (2005): #76,697 of 245,428Top 35%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6879177 Method and testing circuit for tracking transistor stress degradation Ronald J. Bolam, Terrance Wayne Kueper 2005-04-12