Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6891359 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Edward J. Nowak, Alvin W. Strong, Jody Van Horn, Ernest Y. Wu | 2005-05-10 |
| 6879177 | Method and testing circuit for tracking transistor stress degradation | William Paul Hovis, Terrance Wayne Kueper | 2005-04-12 |