Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960523 | Method of reducing erosion of a nitride gate cap layer during reactive ion etch of nitride liner layer for bit line contact of DRAM device | Michael Maldei, Prakash Dev, David M. Dobuzinsky, Johnathan E. Faltermeier, Thomas Rupp +3 more | 2005-11-01 |