Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6968306 | Method and system for determining an interconnect delay utilizing an effective capacitance metric (ECM) signal delay model | Charles J. Alpert, Chandramouli V. Kashyap | 2005-11-22 |
| 6950996 | Interconnect delay and slew metrics based on the lognormal distribution | Charles J. Alpert, Chandramouli V. Kashyap, Ying Liu | 2005-09-27 |
| 6868533 | Method and system for extending delay and slew metrics to ramp inputs | Charles J. Alpert, Chandramouli V. Kashyap, Ying Liu | 2005-03-15 |
| 6842714 | Method for determining the leakage power for an integrated circuit | Emrah Acar, Ying Liu, Sani R. Nassif, Haihua Su | 2005-01-11 |