Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6950767 | Quality monitoring system for building structure, quality monitoring method for building structure and semiconductor integrated circuit device | Kei Suzuki, Toshiyuki Aritsuka, Sadaki Nakano | 2005-09-27 |
| 6845349 | Method for designing semiconductor integrated circuit and automatic designing device | Yasuhiko Sasaki, Kazuo Yano, Koichi Seki | 2005-01-18 |