Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6950767 | Quality monitoring system for building structure, quality monitoring method for building structure and semiconductor integrated circuit device | Shunzo Yamashita, Kei Suzuki, Toshiyuki Aritsuka | 2005-09-27 |
| 6877087 | Substituting specified instruction with NOP to functional unit and halting clock pulses to data latches for power saving | Tetsuya Yamada, Tomoichi Hayashi, Takanobu Tsunoda, Osamu Nishii | 2005-04-05 |