Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6919958 | Wafer metrology apparatus and method | Fred E. Stanke, Clinton Carlisle, Hung Pham, Edric Tong, Douglas E. Ruth +3 more | 2005-07-19 |
| 6886404 | Fiber optic accelerometer | Michel J. F. Digonnet, John J. Fling | 2005-05-03 |