Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6977386 | Angular aperture shaped beam system and method | Mark W. Utlaut | 2005-12-20 |
| 6949756 | Shaped and low density focused ion beams | Mark W. Utlaut, Paul P. Tesch, Richard Young, Clive D. Chandler, Karl D. van der Mast | 2005-09-27 |
| 6946654 | Collection of secondary electrons through the objective lens of a scanning electron microscope | Karel Diederick Van Der Mast, Michael R. Scheinfein | 2005-09-20 |
| 6900447 | Focused ion beam system with coaxial scanning electron microscope | Mark W. Utlaut, Michael R. Scheinfein | 2005-05-31 |