Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946654 | Collection of secondary electrons through the objective lens of a scanning electron microscope | Robert L. Gerlach, Karel Diederick Van Der Mast | 2005-09-20 |
| 6900447 | Focused ion beam system with coaxial scanning electron microscope | Robert L. Gerlach, Mark W. Utlaut | 2005-05-31 |