Issued Patents 2005
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975125 | Semiconductor device tester | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2005-12-13 |
| 6946857 | Semiconductor device tester | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2005-09-20 |
| 6943043 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Keizo Yamada, Yohsuke Itagaki, Tohru Tsujide | 2005-09-13 |
| 6850079 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Keizo Yamada, Yousuke Itagaki | 2005-02-01 |
| 6842663 | Production managing system of semiconductor device | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2005-01-11 |
| 6837936 | Semiconductor manufacturing device | Keizo Yamada, Yousuke Itagaki | 2005-01-04 |