Issued Patents 2005
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975125 | Semiconductor device tester | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2005-12-13 |
| 6967327 | Contact hole standard test device, method of forming the same, method testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer | — | 2005-11-22 |
| 6946857 | Semiconductor device tester | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2005-09-20 |
| 6943043 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Takeo Ushiki, Yohsuke Itagaki, Tohru Tsujide | 2005-09-13 |
| 6940296 | Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer | — | 2005-09-06 |
| 6914444 | Semiconductor device test method and semiconductor device tester | — | 2005-07-05 |
| 6900645 | Semiconductor device test method and semiconductor device tester | — | 2005-05-31 |
| 6897440 | Contact hole standard test device | — | 2005-05-24 |
| 6850079 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Yousuke Itagaki, Takeo Ushiki | 2005-02-01 |
| 6842663 | Production managing system of semiconductor device | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2005-01-11 |
| 6837936 | Semiconductor manufacturing device | Takeo Ushiki, Yousuke Itagaki | 2005-01-04 |