Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975764 | Fast high-accuracy multi-dimensional pattern inspection | Aaron S. Wallack, Adam Wagman | 2005-12-13 |
| 6856698 | Fast high-accuracy multi-dimensional pattern localization | Aaron S. Wallack, Adam Wagman | 2005-02-15 |
| 6850646 | Fast high-accuracy multi-dimensional pattern inspection | Aaron S. Wallack, Adam Wagman | 2005-02-01 |