Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975764 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2005-12-13 |
| 6959112 | Method for finding a pattern which may fall partially outside an image | — | 2005-10-25 |
| 6941016 | Method for finding contours in an image of an object | Ivan Bachelder | 2005-09-06 |
| 6856698 | Fast high-accuracy multi-dimensional pattern localization | William M. Silver, Aaron S. Wallack | 2005-02-15 |
| 6850646 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2005-02-01 |