Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975128 | Electrical, high temperature test probe with conductive driven guard | Bryan J. Root | 2005-12-13 |
| 6963207 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Bryan J. Root | 2005-11-08 |