Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975128 | Electrical, high temperature test probe with conductive driven guard | William A. Funk | 2005-12-13 |
| 6963207 | Apparatus and method for terminating probe apparatus of semiconductor wafer | William A. Funk | 2005-11-08 |
| 6882168 | Probe tile for probing semiconductor wafer | — | 2005-04-19 |