Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937334 | Method of measuring alignment of a substrate with respect to a reference alignment mark | Jacobus Hermanus Maria Neijzen, Jan Evert Van Der Werf | 2005-08-30 |
| 6937344 | Method of measuring overlay | Jacobus Hermanus Maria Neijzen, Jan Evert Van Der Werf | 2005-08-30 |