Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6977195 | Test structure for characterizing junction leakage current | John J. Bush, Robert H. Dawson | 2005-12-20 |
| 6881616 | System for forming a semiconductor device and method thereof including implanting through a L shaped spacer to form source and drain regions | Kay Hellig, Douglas J. Bonser | 2005-04-19 |