NH

Niels-Wieland Hauptmann

AM AMD: 1 patents #405 of 906Top 45%
📍 Fürth, DE: #2 of 13 inventorsTop 20%
Overall (2005): #130,480 of 245,428Top 55%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6949399 Method of reducing contamination-induced process variations during ion implantation Christian Krueger, Thomas Beck 2005-09-27