Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795198 | Method and device for measuring thin films and semiconductor substrates using reflection mode geometry | Martin Fuchs, Keith A. Nelson, John A. Rogers | 2004-09-21 |
| 6734982 | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure | Martin Fuchs, John A. Rogers | 2004-05-11 |
| 6732032 | Wireless diagnostic system for characterizing a vehicle's exhaust emissions | Bruce D. Lightner, Diego Borrego, Chuck Myers, Larkin Hill Lowrey | 2004-05-04 |