Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795198 | Method and device for measuring thin films and semiconductor substrates using reflection mode geometry | Martin Fuchs, Matthew Banet, John A. Rogers | 2004-09-21 |
| 6717717 | Dynamic wavelength shifting method | — | 2004-04-06 |