YL

Yu-Lun Lin

TI Texas Instruments: 1 patents #409 of 1,271Top 35%
📍 College Park, MD: #2 of 13 inventorsTop 20%
🗺 Maryland: #540 of 2,377 inventorsTop 25%
Overall (2004): #80,000 of 270,089Top 30%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6808942 Method for controlling a critical dimension (CD) in an etch process Nital S. Patel, Brian Smith, Jeffrey Stephan Hodges, Dale R. Burrows 2004-10-26