JL

Jacek Lagowski

SD Semiconductor Diagnostics: 3 patents #1 of 9Top 15%
📍 Woburn, MA: #1 of 39 inventorsTop 3%
🗺 Massachusetts: #359 of 6,583 inventorsTop 6%
Overall (2004): #27,487 of 270,089Top 15%
3
Patents 2004

Issued Patents 2004

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6815974 Determining composition of mixed dielectrics Marshall D. Wilson, John F. D'Amico, Alexandre Savtchouk, Lubomir L. Jastrzebski 2004-11-09
6771091 Method and system for elevated temperature measurement with probes designed for room temperature measurement Piotr Edelman, Frank Gossett, Nick Kochey, Alexandre Savtchouk 2004-08-03
6680621 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current Alexander Savtchouk, John F. D'Amico, Marshall D. Wilson, Lubomir L. Jastrzebski 2004-01-20