Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6680621 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Jacek Lagowski, John F. D'Amico, Marshall D. Wilson, Lubomir L. Jastrzebski | 2004-01-20 |