JD

John F. D'Amico

SD Semiconductor Diagnostics: 2 patents #2 of 9Top 25%
📍 Montgomery, NJ: #7 of 55 inventorsTop 15%
🗺 New Jersey: #557 of 5,136 inventorsTop 15%
Overall (2004): #58,362 of 270,089Top 25%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6815974 Determining composition of mixed dielectrics Jacek Lagowski, Marshall D. Wilson, Alexandre Savtchouk, Lubomir L. Jastrzebski 2004-11-09
6680621 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current Alexander Savtchouk, Jacek Lagowski, Marshall D. Wilson, Lubomir L. Jastrzebski 2004-01-20