YM

Yoav Many

NI Nova Measuring Instruments: 1 patents #4 of 10Top 40%
Overall (2004): #82,392 of 270,089Top 35%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6815947 Method and system for thickness measurements of thin conductive layers David Scheiner, Rahamin Guliamov, Shahar Gov 2004-11-09