Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815947 | Method and system for thickness measurements of thin conductive layers | David Scheiner, Yoav Many, Rahamin Guliamov | 2004-11-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815947 | Method and system for thickness measurements of thin conductive layers | David Scheiner, Yoav Many, Rahamin Guliamov | 2004-11-09 |