AR

Avi Ravid

NI Nova Measuring Instruments: 1 patents #4 of 10Top 40%
📍 Kfar Sava, CA: #3 of 3 inventorsTop 100%
Overall (2004): #257,186 of 270,089Top 100%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6801326 Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects Moshe Finarov, David Scheiner 2004-10-05