DC

Daniel P. Cram

Micron: 5 patents #168 of 948Top 20%
📍 Boise, ID: #83 of 590 inventorsTop 15%
🗺 Idaho: #113 of 1,066 inventorsTop 15%
Overall (2004): #9,740 of 270,089Top 4%
5
Patents 2004

Issued Patents 2004

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
6836003 Integrated circuit package alignment feature David J. Corisis, Tracy V. Reynolds, Michael Slaughter, Leland R. Nevill, Jerrold L. King 2004-12-28
6825685 Method and system for wafer level testing and burning-in semiconductor components 2004-11-30
6756802 Test system for electronic modules having contactors with spring segment terminal portions 2004-06-29
6741091 Test method for electronic modules using contractors and conductive polymer contacts 2004-05-25
6727715 Test system and test contactor for electronic modules having beam spring contacts 2004-04-27