Issued Patents 2004
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828690 | Non-uniform minority carrier lifetime distributions in high performance silicon power devices | — | 2004-12-07 |
| 6803576 | Analytical method to measure nitrogen concentration in single crystal silicon | Maria Giovanna Pretto, Maria Porrini, Roberto Scala, Vladimir V. Voronkov, Paolo Collareta | 2004-10-12 |
| 6743289 | Thermal annealing process for producing low defect density single crystal silicon | Martin Jeffrey Binns, Alan Wang | 2004-06-01 |
| 6713370 | Process for the preparation of an ideal oxygen precipitating silicon wafer capable of forming an enhanced denuded zone | — | 2004-03-30 |
| 6709511 | Process for suppressing oxygen precipitation in vacancy dominated silicon | — | 2004-03-23 |
| 6689209 | Process for preparing low defect density silicon using high growth rates | Vladimir V. Voronkov | 2004-02-10 |
| 6686260 | Process for producing thermally annealed wafers having improved internal gettering | Martin Jeffrey Binns, Harold W. Korb | 2004-02-03 |