Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6803576 | Analytical method to measure nitrogen concentration in single crystal silicon | Maria Giovanna Pretto, Maria Porrini, Roberto Scala, Paolo Collareta, Robert J. Falster | 2004-10-12 |
| 6689209 | Process for preparing low defect density silicon using high growth rates | Robert J. Falster | 2004-02-10 |