Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6782525 | Wafer process critical dimension, alignment, and registration analysis simulation tool | Mario Garza, Neal Callan, George E. Bailey, Travis Brist | 2004-08-24 |
| 6768958 | Automatic calibration of a masking process simulator | Lav D. Ivanovic, Mario Garza | 2004-07-27 |
| 6701511 | Optical and etch proximity correction | Mario Garza | 2004-03-02 |