Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6744272 | Test circuit | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2004-06-01 |
| 6724181 | Method of calibrating a test system for semiconductor components, and test substrate | — | 2004-04-20 |
| 6721904 | System for testing fast integrated digital circuits, in particular semiconductor memory modules | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2004-04-13 |