Issued Patents 2004
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6812689 | Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit | Wolfgang Anton Spirkl | 2004-11-02 |
| 6779124 | Selectively deactivating a first control loop in a dual control loop circuit during data transmission | Rainer Höhler | 2004-08-17 |
| 6762611 | Test configuration and test method for testing a plurality of integrated circuits in parallel | Michael Hübner, Justus Kuhn, Jochen Müller, Peter Pöchmüller, Jürgen Weidenhöfer | 2004-07-13 |
| 6756699 | Device and method for calibrating the pulse duration of a signal source | Udo Hartmann | 2004-06-29 |
| 6744272 | Test circuit | Wolfgang Ernst, Justus Kuhn, Jens Luepke, Jochen Mueller, Peter Poechmueller +1 more | 2004-06-01 |
| 6728147 | Method for on-chip testing of memory cells of an integrated memory circuit | Peter Beer, Jochen Kallscheuer | 2004-04-27 |
| 6721904 | System for testing fast integrated digital circuits, in particular semiconductor memory modules | Wolfgang Ernst, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more | 2004-04-13 |