Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6762611 | Test configuration and test method for testing a plurality of integrated circuits in parallel | Michael Hübner, Gunnar Krause, Jochen Müller, Peter Pöchmüller, Jürgen Weidenhöfer | 2004-07-13 |
| 6744272 | Test circuit | Wolfgang Ernst, Gunnar Krause, Jens Luepke, Jochen Mueller, Peter Poechmueller +1 more | 2004-06-01 |
| 6721904 | System for testing fast integrated digital circuits, in particular semiconductor memory modules | Wolfgang Ernst, Gunnar Krause, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more | 2004-04-13 |