Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6762611 | Test configuration and test method for testing a plurality of integrated circuits in parallel | Michael Hübner, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller | 2004-07-13 |