PN

Phillip J. Nigh

IBM: 2 patents #982 of 5,464Top 20%
📍 Peekskill, NY: #12 of 42 inventorsTop 30%
🗺 New York: #1,410 of 9,035 inventorsTop 20%
Overall (2004): #45,954 of 270,089Top 20%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6763314 AC defect detection and failure avoidance power up and diagnostic system Jody Van Horn 2004-07-13
6751765 Method and system for determining repeatable yield detractors of integrated circuits Richard F. Rizzolo, Rocco E. DeStefano, Joseph Eckelman, Thomas G. Foote, Steven Michnowski +2 more 2004-06-15